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Microprocessor design verification by two-phase evolution of variable length tests
Smith, J. , Bartley, M. and Fogarty, T. (1997) Microprocessor design verification by two-phase evolution of variable length tests. In: Proceedings of the 1997 IEEE Conference on Evolutionary Computation, IEEE Press, Piscataway, NJ, USA., pp. 453-458 Full text not available from this repository
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