Microprocessor design verification by two-phase evolution of variable length tests

Smith, J., Bartley, M. and Fogarty, T. (1997) Microprocessor design verification by two-phase evolution of variable length tests. In: Proceedings of the 1997 IEEE Conference on Evolutionary Computation, IEEE Press, Piscataway, NJ, USA, 1997., pp. 453-458

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Item Type:Conference or Workshop Item (Paper)
Uncontrolled Keywords:microprocessor design verification
Faculty/Department:Faculty of Environment and Technology > Department of Computer Science and Creative Technologies
ID Code:11080
Deposited By: A. Lawson
Deposited On:23 Aug 2010 08:14
Last Modified:01 Aug 2013 15:10

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