High speed, multi-scale tracing of curvilinear features with automated scale selection and enhanced orientation computation

Wedowski, R., Farooq, A., Smith, L. and Smith, M. (2010) High speed, multi-scale tracing of curvilinear features with automated scale selection and enhanced orientation computation. In: Smari, W., ed. (2010) International Conference on High Performance Computing and Simulation (HPCS), 2010. IEEE Xplore, pp. 410-417. ISBN 9781424468270

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Publisher's URL: http://dx.doi.org/10.1109/HPCS.2010.5547105

Abstract

We propose a new high speed line tracing algorithm based on a well known differential geometric line extraction algorithm. The previously separate steps of line detection and line tracing are performed simultaneously. This allows the exclusion of non-candidates from processing. Exploiting the inherent continuity of lines and using extracted line characteristics in subsequent detection/tracing also solves the problem of multiple, computationally expensive scale space iterations. Consequently, processing time is shown to be reduced by up to a factor of fifty. Furthermore, the extraction is very sensitive as hard to set global thresholds are no longer required. In the context of these proposals, we also review methods to identify the pixel-wise line orientation. The previously used orientation of maximum second derivative proved to suffer from systematic errors, whereas, our two novel methods proved more reliable. Our algorithm is designed for images containing only a single line but can be applied to images with multiple lines, especially if the global image structure is known.

Item Type:Book Section
Additional Information:Copyright © 2010 IEEE. Reprinted from International Conference on High Performance Computing and Simulation (HPCS), 2010. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of the University of the West of England (UWE's) products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it.
Uncontrolled Keywords:curve tracing, gaussian scale space, high speed, line detection, sub-pixel
Faculty/Department:Faculty of Environment and Technology > Department of Engineering Design and Mathematics
ID Code:13112
Deposited By: J. Newton
Deposited On:18 Nov 2010 15:14
Last Modified:23 May 2014 06:10

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