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Conference or Workshop Item
Smith, J., Bartley, M. and Fogarty, T. (1997) Microprocessor design verification by two-phase evolution of variable length tests. In: Proceedings of the 1997 IEEE Conference on Evolutionary Computation, IEEE Press, Piscataway, NJ, USA, 1997., pp. 453-458 Available from: http://eprints.uwe.ac.uk/11080
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