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Group by: Item Type | No Grouping | Creators | Year of publication, submission, or completion
Jump to: 2005
Number of items: 2.

2005

Frammelsberger, W., Benstetter, G., Stamp, R., Kiely, J. and Schweinboeck, T. (2005) Simplified tunnelling calculations for MOS structures with ultra thin oxides for conductive atomic force microscopy measurements. Materials Science and Engineering B, 116 (2). pp. 168-174. ISSN 0921-5107 Available from: http://eprints.uwe.ac.uk/5955

Frammelsberger, W., Benstetter, G., Kiely, J. and Stamp, R. (2005) Thickness determination of thin and ultrathin SiO2 films by C-AFM IV spectroscopy. Applied Surface Science, 252 (6). pp. 2375-2388. ISSN 01694332 Available from: http://eprints.uwe.ac.uk/5956

This list was generated on Sun Sep 25 02:55:07 2016 BST.

 

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