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Frammelsberger, W. print, Benstetter, G. print, Stamp, R. print, Kiely, J. print and Schweinboeck, T. print (2005) Simplified tunnelling calculations for MOS structures with ultra thin oxides for conductive atomic force microscopy measurements. Materials Science and Engineering B, 116 (2). pp. 168-174. ISSN 0921-5107
Frammelsberger, W. print, Benstetter, G. print, Kiely, J. print and Stamp, R. print (2005) Thickness determination of thin and ultrathin SiO2 films by C-AFM IV spectroscopy. Applied Surface Science, 252 (6). pp. 2375-2388. ISSN 01694332
This list was generated on Sat May 25 02:45:32 2013 BST.