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Jump to: 2005
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2005

Frammelsberger, W., Benstetter, G., Stamp, R., Kiely, J. and Schweinboeck, T. (2005) Simplified tunnelling calculations for MOS structures with ultra thin oxides for conductive atomic force microscopy measurements. Materials Science and Engineering B, 116 (2). pp. 168-174. ISSN 0921-5107

Frammelsberger, W., Benstetter, G., Kiely, J. and Stamp, R. (2005) Thickness determination of thin and ultrathin SiO2 films by C-AFM IV spectroscopy. Applied Surface Science, 252 (6). pp. 2375-2388. ISSN 01694332

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