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Gale, E. (2012) The memory-conservation model of memristance. In: Heber, J., Schlom, D., Tokura, Y., Waser, R. and Wutting, M., eds. (2012) Technical Digest of Frontiers in Electronic Materials. Germany: Nature Conferences & Wiley VCH, pp. 538-539. Available from: http://eprints.uwe.ac.uk/17064
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